PELCO SEMClip™ Pin Mounts for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, CamScan and Tescan SEMs

PELCO SEMClip™ Pin Mounts for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, CamScan and Tescan SEMsThe PELCO SEMClip SEM specimen mounts have been specifically designed to provide an easy, quick and clean way to mount any type of thin specimen on a specimen stub. The spring loaded clips can accommodate samples with a thickness up to 2mm. The samples are held down securely by a small spring loaded clip and allow for easy change of samples. They do not require the use of adhesives thus avoiding waiting times and possible outgassing issues. The PELCO

Economical

Economy High Profile blades

as an exception some batches can contain impurities up to 200 ppm

Clamping bars and clamps can be purchased additionally to make up the best functional set for the job at hand

no element more than 1ppm) graphitized carbon

157") wide x 5mm (0

Accommodates up to eight standard 12

15 x 10mm H for JEOL

PELCO® Multi-Angle SEM Preparation Station

Anti-corrosive

000x better than a typical poly bag

Technical Data: All-In-One   Cantilever A Cantilever B Cantilever C Cantilever D Application Contact Mode Force modulation