SKU:1100060969
PELCO® AFM Tip & Resolution Test Specimen
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USA
- USA
- CAN
- USA
- CAN
Ships within 48 hours · Estimated delivery Aug 4 - Aug 9
Description
PELCO® AFM Tip & Resolution Test SpecimenThis product is intended for checking the tip sharpness (not height calibration); AFM tips wear down and can get damaged resulting in blurry lines, especially at the nano scale. For example, a worn tip would have the cobalt particles looking oblong rather than round. The second feature of this product is in helping the microscopist get down to the nanoscale. having a uniform coverage of nanoscale features, you know what to look for and what to expect.
Ø15 x 15mm H (low)
Hellendahl Type Staining Dish
Chemical mapping - EDS
Open sides for easier sample removal
SEM: Auger
5mm window
Hitachi M4 adapter to standard 1/8" (3
which makes it easy to measure the 500nm pitch
5nm atomic layer-deposited hydroxylated alumina on 15
gelatin capsules
Table size is 11x14mm (0
doubling specimen capacity
Quick Dispatch:
Your PELCO® AFM Tip & Resolution Test Specimen orders ship within 1-2 business days.
Delivery Options:
- Standard: 3-7 business days
- Fast: 2-3 business days
- Express: 1-2 business days
Order Tracking:
You'll receive a tracking link by email once your PELCO® AFM Tip & Resolution Test Specimen ships.
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Exchange/Return Notes
- We offer a 30-day return/exchange service after receiving.
- Final sale items are not eligible for returns or exchanges.
- To process your return/exchange, please contact us at [email protected]
- Please click here for more details>>> Return & Exchange Policy